
AD1870–SPECIFICATIONS
REV. A
–2–
TEST CONDITIONS UNLESS OTHERWISE NOTED
Supply Voltages
Ambient Temperature
Input Clock (f
CLKIN
) [256
×
f
S
]
Input Signal
5.0
25
12.288
991.768
–0.5
23.2 Hz to 19.998 kHz
50
2.4
0.8
V
°
C
MHz
Hz
dB Full Scale
Measurement Bandwidth
Load Capacitance on Digital Outputs
Input Voltage HI (V
IH
)
Input Voltage LO (V
IL
)
Master Mode, Data I
2
S-Justified (Refer to Figure 14).
Device Under Test (DUT) bypassed and decoupled as shown in Figure 3.
DUT is antialiased and ac-coupled as shown in Figure 2. DUT is calibrated.
Values in
bold
typeface are tested; all others are guaranteed but not tested.
pF
V
V
ANALOG PERFORMANCE
Min
Typ
Max
Unit
Resolution
Dynamic Range (20 Hz to 20 kHz, –60 dB Input)
Without A-Weight Filter
With A-Weight Filter
Signal to (THD + Noise)
Signal to THD
Analog Inputs
Single-Ended Input Range (
±
Full Scale)
*
Input Impedance at Each Input Pin
V
REF
DC Accuracy
Gain Error
Interchannel Gain Mismatch
Gain Drift
Midscale Offset Error (After Calibration)
Midscale Drift
Crosstalk (EIAJ Method)
16
Bits
89
92
86.5
93
96
90.5
94
dB
dB
dB
dB
V
REF
±
1.49
32
2.25
V
k
V
2.05
2.55
±
0.5
0.05
115
±
3
–0.2
–110
2.5
%
dB
ppm/
°
C
LSBs
LSB/
°
C
dB
20
–100
*
V
IN
p-p
=
V
REF
×
1.326.
Minimum Input
V
V
Maximum Input
V
V
REF
REF
REF
REF
=
×
=
+
×
–
.
.
1 326
2
1 326
2